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dc.contributor.authorMandviwala, Tasneem A.
dc.contributor.authorLópez-Alonso, José Manuel
dc.contributor.authorLail, Brian A.
dc.contributor.authorBoreman, Glenn D.
dc.date.accessioned2017-06-01T15:28:02Z
dc.date.available2017-06-01T15:28:02Z
dc.date.issued2006-05-12
dc.identifier.citationMandviwala, T. A., López-Alonso, J. M., Lail, B. A., & Boreman, G. D. (2006). Characterization of transmission lines at IR. Paper presented at the Proceedings of SPIE - the International Society for Optical Engineering, 6212 doi:10.1117/12.666066en_US
dc.identifier.urihttp://hdl.handle.net/11141/1460
dc.description.abstractWe demonstrate the first long wave infrared (LWIR) transmission line design and characterization. Two of the widely used transmission-lines: coplanar striplines (CPS) and microstrip (MS) lines are characterized at IR frequency (28.3THz), in terms of transmission line parameters: characteristic impedance (Z₀, attenuation constant (α) and effective index of refraction (nᵉᶠᶠ), through modeling, fabrication and measurement. These transmission-line parameters cannot be directly measured, what can be measured is the antenna response. So we compute, measure and compare the response of the dipole antenna connected to these transmission lines as a function of transmission-line length. The response depends on the transformation of antenna impedance along the transmission-line length according to the transmission-line parameters (Z₀, α and nᵉᶠᶠ) of the line. Comparison of measured and computed response validates extracted transmission-line parameters. This paper demonstrates excellent agreement between measured and computed response for both types of transmission-lines under study.en_US
dc.language.isoen_USen_US
dc.rightsThis published article is made available in accordance with publishers policy. It may be subject to U.S. copyright law.en_US
dc.rights.urihttp://spie.org/publications/journals/guidelines-for-authors#Terms_of_Useen_US
dc.titleCharacterization of transmission lines at IRen_US
dc.typeConference Proceedingen_US
dc.identifier.doi10.1117/12.666066


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