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dc.contributor.authorLowrie, Christopher G.
dc.contributor.authorEarles, S. K.
dc.contributor.authorPozo de Fernandez, Maria E.
dc.date.accessioned2017-04-28T17:12:07Z
dc.date.available2017-04-28T17:12:07Z
dc.date.issued2008-02-13
dc.identifier.citationLowrie, C., Earles, S., & De Fernandez, M. (2008). Porous silicon surface feature size estimation using the reflectance spectrum. Paper presented at the Proceedings of SPIE - the International Society for Optical Engineering, 6898 doi:10.1117/12.759323en_US
dc.identifier.urihttp://hdl.handle.net/11141/1369
dc.description.abstractIn this paper we excite the surface of porous silicon with incoherent, broad band white light and observe the spectrum of colors reflected from the surface. Using an atomic force microscope images from red and green porous silicon samples are collected. In this paper we relate the optical color of the surface to the size of scattering features on the textured surface. From image segmentation using the watershed transform the height distributions of the optical scattering features are determined. The heights of these surface features are then used as input variables to a computer simulation of a reflective grating. The computer predicted color is compared to the measured color. In this manner, by inspection of the reflected color from the textured porous silicon surface the physical size of the surface features can be estimated.en_US
dc.language.isoen_USen_US
dc.rightsThis published article is made available in accordance with publishers policy. It may be subject to U.S. copyright law.en_US
dc.rights.urihttp://spie.org/publications/journals/guidelines-for-authors#Terms_of_Useen_US
dc.titlePorous silicon surface feature size estimation using the reflectance spectrumen_US
dc.typeConference Proceedingen_US
dc.identifier.doi10.1117/12.759323


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